Fowler-Nordheim tunneling at SiO2/4H-SiC interfaces in metal-oxide-semiconductor field effect transistors

Academic Article

Publication Date:

2014

Iris type:

01.01 Articolo in rivista

List of contributors:

Roccaforte, Fabrizio; Fiorenza, Patrick

Authors of the University:

FIORENZA PATRICK

ROCCAFORTE FABRIZIO

Handle:

https://iris.cnr.it/handle/20.500.14243/227129

Published in:

APPLIED PHYSICS LETTERS

Journal