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Stoichiometry related defects in CdTe crystals

Academic Article
Publication Date:
2004
abstract:
n this work, we report on the structural analyses of undoped CdTe samples grown by the vapor phase and the Bridgman methods. Different techniques were used for determining the structural defects: wet etching, high resolution X-ray diffraction, double crystal X-ray topography and monochromatic SEM-cathodoluminescence mapping. The density and the nature of the structural defects were found to be cor-related to the stoichiometry of the samples, as determined by a detailed analysis of the temperature de-pendence of the partial pressure of the vapors in equilibrium with the solid
Iris type:
01.01 Articolo in rivista
Keywords:
CdTe; wet etching; structural defects; cathodoluminescence; X-ray topography
List of contributors:
Zha, Mingzheng; Ferrari, Claudio; Zappettini, Andrea; Bissoli, Francesco; Armani, Nicola; Salviati, Giancarlo; Zanotti, Lucio
Authors of the University:
BISSOLI FRANCESCO
ZAPPETTINI ANDREA
Handle:
https://iris.cnr.it/handle/20.500.14243/84308
Published in:
PHYSICA STATUS SOLIDI C
Journal
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URL

https://onlinelibrary.wiley.com/doi/abs/10.1002/pssc.200304276
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