Publication Date:
2004
abstract:
n this work, we report on the structural analyses of undoped CdTe samples grown by the vapor phase and the Bridgman methods. Different techniques were used for determining the structural defects: wet etching, high resolution X-ray diffraction, double crystal X-ray topography and monochromatic SEM-cathodoluminescence mapping. The density and the nature of the structural defects were found to be cor-related to the stoichiometry of the samples, as determined by a detailed analysis of the temperature de-pendence of the partial pressure of the vapors in equilibrium with the solid
Iris type:
01.01 Articolo in rivista
Keywords:
CdTe; wet etching; structural defects; cathodoluminescence; X-ray topography
List of contributors:
Zha, Mingzheng; Ferrari, Claudio; Zappettini, Andrea; Bissoli, Francesco; Armani, Nicola; Salviati, Giancarlo; Zanotti, Lucio
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