Data di Pubblicazione:
2009
Abstract:
The preparation of composite layers made of porous silicon (PS) infiltrated with nanostructured carbon is reported. These composite layers were obtained by chemical vapor infiltration (CVI) of mesoporous silicon under process conditions normally employed to grow diamond films by Hot Filament Chemical Vapour Deposition (HFCVD). Micro-Raman spectroscopy and Field Emission Gun Scanning Electron Microscopy (FEG-SEM) techniques showed that diamond nucleation density was very low whilst sp 2 carbon permeated completely, even after 1 h deposition, the thickness of the PS layers that preserved their mesoporous columnar structure.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Chemical vapor infiltration; Electron microscopy; Nanostructured carbon; Porous silicon; Raman spectroscopy
Elenco autori:
Valentini, Veronica; Mattei, Giorgio
Link alla scheda completa:
Titolo del libro:
Selected Peer-Reviewed Papers from 2nd International Conference on Surfaces, Coatings and Nanostructured Materials (NANOSMAT 2007)
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