AMPLITUDES OF RANDOM TELEGRAPH NOISE IN HTSC THIN-FILMS

Amplitudes of Random Telegraph Voltage Noise in YBaCuO and BiSrCaCuO thin films of different microstructures have been investigated. Telegraph voltage noise originates from thermally activated flux jumps converted into voltage signals by means of intrinsic Josephson junction cluster acting as a dc SQUID. Magnetic field dependencies of noise amplitudes are consistent with the proposed model.