Data di Pubblicazione:
1997
Abstract:
Amorphous SiC/SiO2 distributed Bragg reflectors ~DBR! deposited by ion beam sputtering at room
temperature is reported on in this letter. The DBR consists of only 2.5 pairs and exhibits high peak
reflectivity ~84%! around ;1.7 mm with a full width at half maximum of about 1000 nm. The
measured reflectivity spectrum is well reproduced by the equivalent layer theory by using the
measured refractive indices of SiC and SiO2 and including absorption losses.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Convertino, Annalisa
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