Publication Date:
2004
abstract:
Abstract--Single Pole Single Through (SPST) series
micromachined switches have been characterized to check their
reliability under low (3 dBm) and medium (23 dBm) power
cycling. Negligible changes of the electrical performances have
been recorded in low power regime, while failure or decrease of
the elctrical response is obtained for the medium power test
around 10^5 cycles. Continuous medium power injection does not
result in any failure for the optimized switch configuration
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
RF-MEMS; Switches; Reliability; Power Handling
List of contributors:
Catoni, Simone; Minucci, Gianluca; Marcelli, Romolo
Book title:
Proceedings of the 5th Workshop on MEMS for Millimeter Wave Communications, MEMSWAVE 2004