Data di Pubblicazione:
1994
Abstract:
We report on a study of the empty states at the Cu/Si(111)7 x 7 interface via polarization-dependent Cu L(2,3) X-ray absorption spectrescopy (XAS) as a function of the Cu coverage (0.25-5ML). Joint analysis of the CuL(3) XAS line-shapes of Cu-based reference compounds allows us to interpret the high coverage spectra in terms of pseudo-stoichiometric Cu-silicides.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Iacobucci, Stefano
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