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Secondary ion mass spectrometry studies on the formation of the valve metal oxide in ruthenium- and iridium-based mixed oxide electrodes

Academic Article
Publication Date:
1996
abstract:
The process of TiO evolution from titanium diisopropoxide bis-2,4-pentanedionate precursor on nickel and titanium supports was followed by secondary ion mass spectrometry. Concentration depth profiles of rutile (TiO) at higher temperatures showed completely different patterns for the two supports, indicating the influence of the base metal on the formation and properties of the oxide coating. The formation and surface accumulation of elemental carbon during combustion of the organic matter were followed as a function of temperature. The results obtained are in agreement with those of previous measurements by simultaneous thermogravimetry-differential thermal analysis, thermogravimetry combined with mass spectrometry and emission FTIR spectrometry. © 1996 Elsevier Science B.V. All rights reserved.
Iris type:
01.01 Articolo in rivista
Keywords:
Depth profiling; Electrocatalysis; Mixed oxide coatings; Secondary ion mass spectrometry; Titanium dioxide
List of contributors:
Piccirillo, Clara
Authors of the University:
PICCIRILLO CLARA
Handle:
https://iris.cnr.it/handle/20.500.14243/426840
Published in:
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES
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http://www.scopus.com/record/display.url?eid=2-s2.0-3743076453&origin=inward
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