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Role of secondary ion mass spectrometric analysis in the brazing of precious alloys

Articolo
Data di Pubblicazione:
1997
Abstract:
Secondary ion mass spectrometric characterization of Cd-free and Cd-containing brazing alloys for jewelry are presented, analyzing the surface composition and elemental distribution along the thickness both for master alloys and brazed joints. It was verified that the brazing process induced little modification in In-containing alloys. On the other hand, Cd evaporation from the alloy was verified after heating, confirming its danger to health under these conditions. The presence of intermetallic dusters was detected, indicating interactions between brazing alloys and 18 carat gold.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Secondary Ion Mass Spectrometry; Precious alloys
Elenco autori:
Fabrizio, Monica; Piccirillo, Clara
Autori di Ateneo:
FABRIZIO MONICA
PICCIRILLO CLARA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/426834
Pubblicato in:
RCM. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
Journal
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http://www.scopus.com/record/display.url?eid=2-s2.0-0030847264&origin=inward
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