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Secondary ion mass spectrometry characterization of IrO2-Ta2O5 thin films: Effect of relative composition on electrode properties

Articolo
Data di Pubblicazione:
1998
Abstract:
IrO and TaO mixed oxide coatings were deposited on Ti supports in order to fabricate dimensionally stable electrodes used in chloro-alkali technology. Secondary ion mass spectrometry (SIMS) and electrochemical experiments were carded out in order to characterize these materials. Electrochemical tests found the highest electrocatalytic activity for 50% IRO-50% TaO electrodes. SIMS analyses are in harmony with these results, and it is shown that IrO is more diluted on the surface for noble metal oxide concentrations higher than 50%. Finally, it was observed by SIMS that support material migration was favoured at the highest concentrations of TaO stabilizer.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Secondary Ion Mass Spectrometry; Iridium oxide; electrochemistry
Elenco autori:
Fabrizio, Monica; Piccirillo, Clara
Autori di Ateneo:
FABRIZIO MONICA
PICCIRILLO CLARA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/426832
Pubblicato in:
RCM. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
Journal
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http://www.scopus.com/record/display.url?eid=2-s2.0-0031733922&origin=inward
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