Secondary ion mass spectrometry characterization of IrO2 -Ta2 O5 thin films: Effect of relative composition on electrode properties
Academic Article
Publication Date:
1998
abstract:
IrO and TaO mixed oxide coatings were deposited on Ti supports in order to fabricate dimensionally stable electrodes used in chloro-alkali technology. Secondary ion mass spectrometry (SIMS) and electrochemical experiments were carded out in order to characterize these materials. Electrochemical tests found the highest electrocatalytic activity for 50% IRO-50% TaO electrodes. SIMS analyses are in harmony with these results, and it is shown that IrO is more diluted on the surface for noble metal oxide concentrations higher than 50%. Finally, it was observed by SIMS that support material migration was favoured at the highest concentrations of TaO stabilizer.
Iris type:
01.01 Articolo in rivista
Keywords:
Secondary Ion Mass Spectrometry; Iridium oxide; electrochemistry
List of contributors:
Fabrizio, Monica; Piccirillo, Clara
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