Pressure broadening in the second overtone of NO, measured with a near infrared DFB diode laser

Fundamental spectroscopical parameters of the second overtone band (3 <-- 0) of NO are reported using a high resolution, direct absorption spectrometer, based on a distributed feedback diode laser emitting at 1.8 mu m. Line intensity, self- and nitrogen-line broadening coefficients have been measured with high accuracy in the second overtone of NO, far 7 groups of lines belonging to the R branch, from R(6.5) up to R(13.5) of the two electronic states (2)Pi(1/2) and (2)Pi(3/2). The results for this band have been compared with available data on the fundamental band and the first overtone.