Data di Pubblicazione:
2000
Abstract:
Scanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices. Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Keywords:
Atomic force microscopy; Lithography; Local anodic
Elenco autori:
Giovine, Ennio; Notargiacomo, Andrea
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