Skip to Main Content (Press Enter)

Logo CNR
  • ×
  • Home
  • People
  • Outputs
  • Organizations
  • Expertise & Skills

UNI-FIND
Logo CNR

|

UNI-FIND

cnr.it
  • ×
  • Home
  • People
  • Outputs
  • Organizations
  • Expertise & Skills
  1. Outputs

SPM based lithography for nanometer scale electrodes fabrication

Conference Paper
Publication Date:
2000
abstract:
Scanning probe assisted nanolithography is a very attractive technique in terms of low-cost, patterning resolution and positioning accuracy. Our approach makes use of a commercial atomic force microscope and silicon probes to build simple nanostructures, such as metal electrode pairs, for application in novel quantum devices. Sub-100 nm patterning was successfully performed using three different techniques: direct material removal, scanning probe assisted mask patterning and local oxidation.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
Atomic force microscopy; Lithography; Local anodic
List of contributors:
Giovine, Ennio; Notargiacomo, Andrea
Authors of the University:
GIOVINE ENNIO
NOTARGIACOMO ANDREA
Handle:
https://iris.cnr.it/handle/20.500.14243/362205
Published in:
MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
Journal
  • Overview

Overview

URL

http://www.scopus.com/record/display.url?eid=2-s2.0-0033678008&origin=inward
  • Use of cookies

Powered by VIVO | Designed by Cineca | 26.5.0.0 | Sorgente dati: PREPROD (Ribaltamento disabilitato)