Studying the heterogeneity of the CrxTi1-xCh2 (Ch = S, Se) single crystals using X-ray scanning photoemission microscopy

The morphology of the heterogeneous CrTiSe and CrTiS single crystals has been studied using X-ray scanning photoemission microscopy (SPEM) and angular resolved photoemission spectroscopy (ARPES). A direct method of SPEM provided us the insight into the origin of the blurred ARPES images for CrTiSe single crystal. Using SPEM, we confirmed the formation of the CrSe-based structural fragments inside the CrTiSe single crystals with x >= 0.75. The chemical composition of the forming structural fragments depends on the chalcogen (S, Se) forming the crystal lattice.