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Structural and Electronic Reconstructions at the LaAlO3 /SrTiO3 Interface (Adv. Mater. 16/2013)

Academic Article
Publication Date:
2013
abstract:
A full understanding of the mechanism of the formation of a two-dimensional electron gas (2DEG) at the interface between insulating LaAlO3 (LAO) thin films and bulk SrTiO3 (STO) crystals is a prerequisite for the full exploitation of this class of materials. Here, by using a combination of advanced X-ray synchrotron-based spectroscopic and structural measurements, it is shown that a structural and electronic reconstruction of the interface occurs before the realization of the 2DEG.
Iris type:
01.01 Articolo in rivista
Keywords:
polar oxide interfaces; LAO/STO; two-dimensional electron gas (2DEG); X-ray absorption spectroscopy; surface diffraction
List of contributors:
Salluzzo, Marco
Authors of the University:
SALLUZZO MARCO
Handle:
https://iris.cnr.it/handle/20.500.14243/205281
Published in:
ADVANCED MATERIALS (WEINH., PRINT)
Journal
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URL

http://dx.doi.org/10.1002/adma.201204555
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