LIGHT-BEAM INDUCED CURRENT IMAGING OF THE ELECTRICAL-ACTIVITY OF STACKING-FAULTS IN CZ SILICON

Academic Article

Publication Date:

1989

Iris type:

01.04 Nota a sentenza

List of contributors:

Poggi, Antonella; Susi, Enrichetta

Authors of the University:

POGGI ANTONELLA

Handle:

https://iris.cnr.it/handle/20.500.14243/237119

Published in:

REVUE DE PHYSIQUE APPLIQUEE

Journal