SIMS AND X-RAY-DIFFRACTION CHARACTERIZATION OF CARBON-DOPED GAAS, ALXGA1-XAS FILMS GROWN BY MBE

Academic Article

Publication Date:

1994

Iris type:

01.01 Articolo in rivista

List of contributors:

Giannini, Cinzia

Handle:

https://iris.cnr.it/handle/20.500.14243/286741

Published in:

SIA. SURFACE AND INTERFACE ANALYSIS

Journal