VUV reflectance measurements and optical constants of SiC thin films

Academic Article

Publication Date:

2005

Iris type:

01.01 Articolo in rivista

List of contributors:

Pelizzo, MARIA GUGLIELMINA

Handle:

https://iris.cnr.it/handle/20.500.14243/204621

Published in:

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA

Journal