Reliability of RF MEMS Capacitive and Ohmic Switches for Space Redundancy Configurations
Conference Paper
Publication Date:
2013
abstract:
In this paper RF MEMS switches in coplanar waveguide (CPW) configuration designed for redundancy space applications have been analyzed, to demonstrate their reliability in terms of microwave performances when subjected to DC actuations up to one million cycles. As a result, both the investigated structures fulfill the current electrical requirements expected for redundancy logic purposes.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
RF MEMS; reliability; redudancy; space applications
List of contributors:
Bartolucci, Giancarlo; Proietti, Emanuela; Lucibello, Andrea; Marcelli, Romolo
Book title:
Proceedings of DTIP 2013, SYMPOSIUM on Design, Test, Integration & Packaging of MEMS/MOEMS, Barcelona, 16-18 April 2013.