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Secondary ion mass spectrometric investigation of Au-based composites

Academic Article
Publication Date:
2001
abstract:
The electrodeposition of thick gold layers plays an important role both in traditional and high-tech productions, such as jewelry and microelectronics, respectively. In this work a secondary ion mass spectrometric study will be presented on Au co-deposits with (sub-)micrometric ceramic powders, in order to harden gold. Mass spectra are used to identify the components deposited, providing evidence of the additives and/or eventual contaminants introduced during electrolysis. Furthermore, analysis of ion depth profiles and the intensity distribution of ionic species along the film were studied. Copyright © 2001 John Wiley & Sons, Ltd.
Iris type:
01.01 Articolo in rivista
Keywords:
secondary ion mass spectrometry; gold alloys
List of contributors:
Fabrizio, Monica; Barison, Simona; Piccirillo, Clara
Authors of the University:
BARISON SIMONA
FABRIZIO MONICA
PICCIRILLO CLARA
Handle:
https://iris.cnr.it/handle/20.500.14243/424666
Published in:
RCM. RAPID COMMUNICATIONS IN MASS SPECTROMETRY
Journal
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http://www.scopus.com/record/display.url?eid=2-s2.0-0034753774&origin=inward
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