Dielectric response of the manganese thiophosphate intercalated with potassium ions

The dielectric response of the layered MnPS3 compound intercalated with potassium ions has been investigated as a function of frequency and temperature. The dielectric behavior, examined between 240 and 375K and in the (20 Hz–1 MHz) frequency range, is characterized by a strong dispersion in the real and imaginary parts of the dielectric constant at the low frequencies and at the highest investigated temperatures. The obtained dielectric spectra, which have been interpreted on the basis of both the intercalation process by cationic substitution and the comparison with the observed dielectric response of the parent MnPS3 and its intercalated compound with cesium ions Cs0.46Mn0.77PS3, have allowed us to define K0.5Mn0.75PS3 as a hopping charge carrier system.