Data di Pubblicazione:
2002
Abstract:
A CCD calibration system based on a laser-plasma X-ray source has been developed. The system is particularly suited for CCD calibration in the soft X-ray spectral range and allows the user to continuously tune in energy the incident radiation. This last issue is of great interest when studying the X-ray response of Si detectors near the K-edge. We report on the use of this facility for calibration of a back-illuminated CCD for single-photon spectroscopy of laser-plasma emission.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
EMISSION; EFFICIENCY; RESOLUTION; SCATTERING; DETECTOR; SILICON; BOARD
Elenco autori:
Giulietti, Danilo; Gizzi, LEONIDA ANTONIO; Giulietti, Antonio
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