Data di Pubblicazione:
2002
Abstract:
In this paper the results of the deposition of thin films of hafnium
carbide by pulsed laser ablation deposition are reported. The coatings
characteristics, investigated by conventional techniques such as X-ray
diffraction (XRD), scanning and transmission electron microscopy
(SEM/TEM), and atomic force microscopy (AFM) are discussed in relation
with the properties of the plasma produced in the interaction between the
laser source (frequency doubled Nd:YAG laser) and the target. The plasma
analysis, performed by emission spectroscopy, optical imaging and time of
flight mass spectrometry, is also used to clarify the ablation mechanism
and to compare it with those of the other carbides of the same group.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Hafnium carbide; Pulsed laser ablation; Thin film
Elenco autori:
Marotta, IDA VERONICA; Santagata, Antonio
Link alla scheda completa:
Pubblicato in: