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TEM and HRXRD study of strain release in MBE grown InGaAs/GaAs double heterostructure buffer layers

Conference Paper
Publication Date:
1994
Iris type:
04.01 Contributo in Atti di convegno
List of contributors:
Lazzarini, Laura; Ferrari, Claudio; Nasi, Lucia; Salviati, Giancarlo
Authors of the University:
NASI LUCIA
Handle:
https://iris.cnr.it/handle/20.500.14243/120279
Book title:
ELECTRON MICROSCOPY 1994, VOLS 2A AND 2B: APPLICATIONS IN MATERIALS SCIENCES
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