Impact of neutral threshold-voltage spread and electron-emission statistics on data retention of nanoscale NAND Flash

Academic Article

Publication Date:

2010

Iris type:

01.01 Articolo in rivista

List of contributors:

Osellame, Roberto

Handle:

https://iris.cnr.it/handle/20.500.14243/37046

Published in:

IEEE ELECTRON DEVICE LETTERS (PRINT)

Journal