Ferroelectric (Na1/2Bi1/2)TiO3-BaTiO3 thin films obtained by pulsed laser deposition

The solid solution of the ferroelectric relaxor (Na1/2Bi1/2)TiO3 with BaTiO3, (1-x) NBT-x BT (NBT-BT) shows a morphotropic phase boundary with enhanced properties at x = 0.06-0.07. We have prepared targets of (1-x) NBT-x BT with x = 0.06 by solid state reaction and sintering at 1200 æC, up to a final relative density of 97.8%. Films from these targets have been deposited on MgO substrates by pulsed laser deposition, in different substrate temperature and heating rate conditions. First results obtained from structural,AFMand electrical characterization are reported. The obtained films are polycrystalline perovskite with a slight (100) orientation. High relative dielectric constant, of about 1300, have been obtained.