An EBIC method for the quantitative determination of dopant concentration at striations in LEC GaAs

Abstract
Publication Date:
1987
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
EBIC; GaAs; dopant concentration; striations
List of contributors:
Handle:
https://iris.cnr.it/handle/20.500.14243/120117
Book title:
Abstract book