Spectral characterization of two-dimensional Thue-Morse quasicrystals realized with high resolution lithography
Articolo
Data di Pubblicazione:
2011
Abstract:
One-dimensional Thue-Morse (ThMo) lattices are examples of self-similar structures that exhibit bandgap phenomena. ThMo multilayers may also possess fractal photonic bandgaps that give rise to large omnidirectional reflectance and light-emission enhancement effects. Two-dimensional (2D) ThMo aperiodic quasicrystals possess interesting properties for photonic applications too. Here we demonstrate the experimental fabrication of large area 2D ThMo lattices into polymeric substrates at nanometre scale by electron beam lithography (EBL). Far field diffraction patterns of the experimental ThMo structures have been measured and compared with the calculated theoretical Fourier spectra. Scanning electron microscopy and far field diffraction are used to characterize the experimental structures.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
photonic quasicrystals; electron-beam lithography
Elenco autori:
Rippa, Massimo; Zito, Gianluigi; Abbate, Giancarlo; DE NICOLA, Sergio; Petti, Lucia; Mormile, Pasquale
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