Electrical instability in self-aligned p-channel polysilicon TFTs related to oxide residual damage

Conference Paper

Publication Date:

2007

Iris type:

04.01 Contributo in Atti di convegno

List of contributors:

Rapisarda, Matteo; Mariucci, Luigi; Pecora, Alessandro; Fortunato, Guglielmo; Valletta, Antonio

Authors of the University:

MARIUCCI LUIGI

PECORA ALESSANDRO

RAPISARDA MATTEO

VALLETTA ANTONIO

Handle:

https://iris.cnr.it/handle/20.500.14243/150973