Data di Pubblicazione:
2011
Abstract:
Thin films of silicon carbide (SiC) have been prepared by means of pulsed laser deposition (PLD) on sapphire (Al(2)O(3)) and Si(100) substrates with a Nd-YAG laser 1064 nm. We achieved the growth of cubic silicon carbide (3C-SiC) films at the temperatures of 650A degrees C from a SiC target in vacuum. The as-deposited films are morphologically and structurally characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM) and X-ray diffraction (XRD). The use of off-axis PLD method placing the sample at 90A degrees with respect to the target leads to a good quality smooth film.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
PULSED-LASER DEPOSITION; SIC THIN-FILMS; SILICON-CARBIDE; EXTREME-ULTRAVIOLET; REFLECTANCE MEASUREMENTS
Elenco autori:
Nicolosi, Piergiorgio; Natali, MARCO STEFANO; Pelizzo, MARIA GUGLIELMINA
Link alla scheda completa:
Pubblicato in: