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Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals

Conference Paper
Publication Date:
2006
abstract:
We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200°C by an actively stabilized heater (stability < 0.1°C). The thermal expansion coefficient is determined using a moire interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary and extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
thermal expansion; ferroelectric crystals; INTERFEROMETRIA; CRISTALLI FERROLELETTRICI; NIOBATO DI LITIO; INDICE DI RIFRAZIONE; TEMPERATURA
List of contributors:
DE NICOLA, Sergio; Ferraro, Pietro; DE NATALE, Paolo; DE ROSA, Maurizio; Grilli, Simonetta
Authors of the University:
DE NATALE PAOLO
FERRARO PIETRO
GRILLI SIMONETTA
Handle:
https://iris.cnr.it/handle/20.500.14243/150165
Book title:
Optical Micro- and Nanometrology in Microsystems Technology
Published in:
PROCEEDINGS OF SPIE
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