Application of a coupled electromagnetic-thermal model for 2D analysis of thermal runaway

In this work, a coupled electromagnetic and thermal physical model has been implemented in order to analyse the thermal runaway development during the application of microwave energy. Both static and mode-stirred microwave ovens have been analysed and its influence on the electric field and temperature patterns compared. Additionally, the continuous and pulsed uses of the microwave power source are also compared. Results indicate that temperature permittivity dependence, thermal conductivity and the electric field deposition are mainly responsible for thermal avalanche and 'hot spot' development.