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Breakdown Kinetics at nanometer Scale of Innovative MOS Devices by Conductive Atomic Force microscopy
Academic Article
Publication Date:
2006
Iris type:
01.01 Articolo in rivista
List of contributors:
Fiorenza, Patrick; Raineri, Vito; LO NIGRO, Raffaella
Authors of the University:
FIORENZA PATRICK
LO NIGRO RAFFAELLA
Handle:
https://iris.cnr.it/handle/20.500.14243/28838
