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Scanning Capacitance Microscopy in Microelectronics
Academic Article
Publication Date:
2004
Iris type:
01.01 Articolo in rivista
List of contributors:
Raineri, Vito; Roccaforte, Fabrizio; LO NIGRO, Raffaella; Giannazzo, Filippo
Authors of the University:
GIANNAZZO FILIPPO
LO NIGRO RAFFAELLA
ROCCAFORTE FABRIZIO
Handle:
https://iris.cnr.it/handle/20.500.14243/28818
