Brillouin light scattering investigation of the magnetic properties of Ni films deposited on different substrates

The Brillouin light scattering technique has been exploited for investigating the magnetic properties of Ni films, with thicknesses in the range between 20 and 100 nm, deposited on silicon and sapphire substrates. Detection of both surface and bulk spin waves enabled us to determine the magnetic parameters of these films and to study the influence of the different substrates on these parameters.