Data di Pubblicazione:
2007
Abstract:
Double-gate and tri-gate FinFET type memories with nitride (SONOS-like) or Si nanocrystals storage with minimum feature sizes of 10 nm were realized. Strong performance advantages in program / erase characteristics and reliability deeply linked to the FinFET architecture are demonstrated
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Corso, Domenico; Garozzo, CRISTINA ANNAMARIA; Lombardo, SALVATORE ANTONINO; Bongiorno, Corrado; Puglisi, ROSARIA ANNA
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