Data di Pubblicazione:
2006
Abstract:
In this study we modified and optimized a technique using an ordinary spin-coater device to deposit lipids on chemically etched silicon substrates. Tapping-mode atomic force microscopy is used for sample characterization, thereby realizing non destructive characterization with nanometrical resolution.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Pompeo, Giuliano; Cattaruzza, Fabrizio; Flamini, Alberto; Girasole, Marco; Prosperi, Tommaso; Cricenti, Antonio
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