Energy Dispersive X-ray Reflectometry of the NO2 Interaction with Ruthenium Phthalocyanine Films

The X-ray reflectometry technique in its energy dispersive variant (EDXR) is utilized to study the morphological characteristicsof dimeric ruthenium phthalocyanine (RuPc)2 thin films , wich are being exploited as nitrogen oxide gas sensors . the advantages of the EDXR with respect to its conventional (angular dispersive) countrpart are discussed .the high sensitivity of this technique alloed us to detect minimal variations of the film thicknessand roughness as a consequence of the exposure to a NO2 gas flux , providing information on the gas diffusion process through the film and on the mechanism of interaction between film and gas molecules.