Defect generation in low-energy ion-assisted thermal deposited lithium fluoride films
Academic Article
Publication Date:
2003
abstract:
We present first results concerning stable formation of primary electronic defects and lithium nanometer sized clusters in LiF thin films grown by ion-assisted thermal deposition. The optical and morphological properties of the as grown LiF films, dependent on the deposition conditions, such as ion-beam energy and ion species (Xe, Ar), are reported. The experimental results show a larger efficiency of low-energy Xe ions in inducing the formation of lithium nano-clusters. To analyse the role of the deposition conditions, a preliminary interpretation of the lithium nano-cluster formation mechanism based on the spherical and/or cylindrical spike thermal model is given
Iris type:
01.01 Articolo in rivista
List of contributors:
Mussi, Valentina; Cricenti, Antonio
Published in: