Detection of subwavelength slit-width variation with irradiance measurements in the far field

We demonstrate that, under suitable conditions, subwavelength feature variations of an object can affect the corresponding far-field diffraction pattern in a measurable way. We present an experiment in which width variations of less than 1/100 of the wavelength are measured with a slit whose width is 100 times the wavelength. Integral and differential intensity measurements in the far field are fully consistent with standard diffraction theory even in the subwavelength variation regime. In particular, slit modulations of 6 nm with a wavelength of 670 nm are shown to follow theoretical calculations within the experimental sensitivity of ~10^(-5). © 2002 Optical Society of America