Fourier transform infrared microscopy: some advances in techniques for characterisation and structure-property elucidations of industrial material
Academic Article
Publication Date:
1998
abstract:
FTIR-microscopy has become one of the foremost
vibrational spectroscopy techniques for problem-solving
and analysing and mapping the chemical structure and
physical characteristics associated with industrial
materials and their fabricated products. Many recent
advances have utilised the attributes of reflection
techniques, such as specular reflection spectroscopy
approaches, while emerging capabilities becoming
available to the industrial spectroscopist include both
spectral imaging and use of synchrotron radiation as a
source. This paper seeks to illustrate each of these recent
advances and developments through applications of
FTIR-microscopy to industrial problem-solving case
studies.
Iris type:
01.01 Articolo in rivista
Keywords:
FOURIER TRANSFORM INFRARED MICROSCOPY; SPECULAR REFLECTANCE; MICROSPECTROSCOPY; POLY (ETHYLENE-TEREPHTHALATE); CRYSTALLINITY
List of contributors:
Ruzicka, Barbara
Published in: