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ULTRAMICROSCOPY
Rivista
Codice:
E171686
ISSN:
0304-3991
Dati Generali
Dati Generali
Pubblicazioni (59)
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A holographic biprism as a perfect energy filter?
Articolo
A modeling and convolution method to measure compositional variations in strained alloy quantum dots
Articolo
A novel method for focus assessment in atomic resolution STEM HAADF experiments
Articolo
A sorter for electrons based on elements
Articolo
A sorter for electrons based on magnetic elements
Articolo
AFM structural study of the molecular chaperone GroEL and its two-dimensional crystals: an ideal "living" calibration sample
Articolo
Alignment of electron optical beam shaping elements using a convolutional neural network
Articolo
Atomic force microscopy of histological sections using a chemical etching method
Articolo
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers
Articolo
Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers
Articolo
Charge dynamics in aluminum oxide thin film studied by ultrafast scanning electron microscopy
Articolo
Comparison of spatial resolutions obtained with different signal components in scanning electron microscopy
Articolo
Computer simulations of electron holographic contour maps of superconducting flux lines .
Articolo
Computer simulations of electron holographic contour maps of superconducting flux lines II. The case of tilted specimens
Articolo
Crystal structure solution via precession electron diffraction data: The BEA algorithm
Articolo
Design of electrostatic phase elements for sorting the orbital angular momentum of electrons
Articolo
Elastic and inelastic electrons in the double-slit experiment: A variant of Feynman's which-way set-up
Articolo
Electron microscope calibration for the Lorentz mode
Articolo
Electron microscopy investigations of InxGa1-xAs epilayers
Abstract
Electron spectroscopic imaging of dopant precipitation and segregation in silicon
Articolo
Factors affecting the formation of the EBIC bright halos
Abstract
Fast three-dimensional nanoscale metrology in dual-beam FIB-SEM instrumentation
Articolo
Focused ion beam-nanomachined probes for improved electric force microscopy
Articolo
Force-clamp spectroscopy with a small dithering of AFM tip, and its application to explore the energy landscape of single avidin-biotin complex
Articolo
Four slits interference and diffraction experiments
Articolo
Generation and application of bessel beams in electron microscopy
Articolo
Generation of a spin-polarized electron beam by multipole magnetic fields
Articolo
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy
Articolo
Imaging of ferroelectric thin films by X-ray photoemission electron microscopy (XPEEM)
Articolo
Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis
Articolo
Influence of electron-beam parameters on the radiation-induced formation of graphitic onions
Articolo
Insights into image contrast from dislocations in ADF-STEM
Articolo
Interference electron microscopy of one-dimensional electron-optical phase objects
Articolo
Investigation of strain distribution in LOCOS structures by dynamical simulation of LACBED patterns
Articolo
Ion microscopy based on laser-cooled cesium atoms
Articolo
Morphology, mechanical properties and viability of encapsulated cell
Articolo
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network
Articolo
ON THE WEAKENING OF SECONDARY-ELECTRON IMAGE BRIGHTNESS IN YBA2CU3O7-X
Abstract
On the resolution of semiconductor multilayers with a scanning electron microscope
Articolo
Patterning pentacene surfaces by local oxidation nanolithography
Articolo
Potential-induced resonant tunneling through a redox metalloprotein investigated by electrochemical scanning probe microscopy
Articolo
QED V 1.0: a software package for quantitative electron diffraction data treatment
Articolo
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: Avoiding surface strain induced artifacts
Articolo
STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials
Articolo
STEM_CELL: A software tool for electron microscopy: Part I-simulations
Articolo
Singlemode chalcogenide fiber infrared SNOM probes
Articolo
Spatial resolution and energy filtering of backscattered electron images in scanning electron microscopy
Articolo
Spectromicroscope for the PHotoelectron Imaging of Nanostructures with X-rays (SPHINX): performance in biology, medicine and geology.
Articolo
Spin polarisation with electron Bessel beams
Articolo
Structure determination of Phi Bi8Pb5O17 by electron and powder X-ray diffraction
Articolo
The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector
Articolo
The effect of surface strain relaxation on HAADF imaging
Articolo
The new FAST module: A portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Articolo
Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy
Articolo
Thinning of Al-Si-Cu cast alloys specimens and Transmission Electron Microscopy Investigations
Abstract
Three dimensional analysis of the composition in solid alloys by variable probe in scanning transmission electron microscopy
Articolo
Ultrasonic force microscopy: Detection and imaging of ultra-thin molecular domains
Articolo
Ultrasonic force miscospy: detection and imaging of ultra-thin molecular domains
Articolo
Wide angle near-field optical probes by reverse tube etching
Articolo
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