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IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS
Serie
Codice:
E243094
ISSN:
1541-7026
Dati Generali
Dati Generali
Pubblicazioni (6)
Analysis of ESD Effects on Organic Thin-Film-Transistors by Means of TLP Technique
Contributo in Atti di convegno
Analysis of ESD effects on organic thin-film-transistors by means of TLP technique
Articolo
Enhanced Threshold Voltage Stability in ZnO Thin-Film-Transistors by Excess of Oxygen in Atomic Layer Deposited Al2O3
Articolo
Evaluation of silicon, organic, and perovskite solar cell reliability with low-frequency noise spectroscopy
Contributo in Atti di convegno
Improvement of DSSC performance by voltage stress application
Articolo
Open Circuit Voltage Decay as a Tool to Asses the Reliability of Organic Solar Cells: P3HT:PCBM vs. HBG1:PCBM
Contributo in Atti di convegno
No Results Found
