SIMS characterization of La0.7Sr0.3MnO3 films for solid oxide fuel cell applications

Among solid oxides exploited to prepare efficient fuel cells,
La1-xSrxMnO3 manganites have been widely studied and used as cathodes, because
of their high conductivity at the working temperatures, good thermal stability and
compatibility with other cell components. A fundamental goal in solid oxide fuel
cells technology consists in lowering the normal operating temperatures, e.g.
increasing the surface/volume ratio of electrodic materials, so as to enhance their
catalytic performances. In this work, the preparation of high surface area
La1-xSrxMnO3 (x ? 0.3) films on silicon wafers by the nitrate-citrate Pechini process
is described. The films were characterized by X-ray diffraction, Atomic Force
Microscopy and Secondary Ion Mass Spectrometry. Good quality nanostructured
perovskite-type films were obtained. SIMS methodology enabled to show the surface
and in-depth coatings composition and residual contaminants. Moreover, it allowed
defining the best synthesis conditions for complete in-depth decomposition of
precursors and obtaining homogeneously thick coatings.