Determination of bulk mismatch values in trasmission electron microscopy cross-sections of heteostructures by convergent-beam electron diffraction

Academic Article
Publication Date:
1998
Iris type:
01.01 Articolo in rivista
Keywords:
RELAXATION; SI1-XGEX; SILICON; STRAIN; GROWTH
List of contributors:
Authors of the University:
Handle:
https://iris.cnr.it/handle/20.500.14243/209947
Published in:
PHILOSOPHICAL MAGAZINE. A. PHYSICS OF CONDENSED MATTER. DEFECTS AND MECHANICAL PROPERTIES
Journal