Data di Pubblicazione:
1993
Abstract:
Two different Sb-induced phases have been found upon annealing on freshly evaporated Si(100)2 x 1 surfaces. The surface electronic structures of the two phases (1 x 1-Sb and 2 x 1-Sb) have been studied with surface differential reflectivity (SDR) and angle-resolved photoelectron spectroscopy (ARUPS). Both techniques show the existence of a gap of approximately 1.6 and 1.4 eV for the two phases, with the empty state located near the Fermi level.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY; SURFACES; SILICON; SB
Elenco autori:
Ferrari, Luisa; Cricenti, Antonio; Selci, Stefano
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