Pressure broadening in the second overtone of NO, measured with a near infrared DFB laser

Fundamental spectroscopical parameters of the second overtone band (3-0) of NO are reported using a high resolution, direct absorption spectrometer, based on a distributed feedback diode laser emitting at 1.8 micron. Line intensity, self- and nitrogen-line broadening coefficients have been measured with high accuracy in the second overtone of NO, for 7 groups of lines belonging to the R branch, from R(6.5) up to R(13.5) of the two electronic states 2 PI 1/2 and 2 PI 3/2 . The results for this
band have been compared with available data on the fundamental band and the first overtone