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SIMS characterization of NdBa2Cu3O7-x and EuBa2Cu3O7-x single crystals

Articolo
Data di Pubblicazione:
1998
Abstract:
The surface features of NdBa2Cu3O7ÿ and EuBa2Cu3O7ÿ single crystals grown from a BaO/CuO flux at
high temperatures were investigated by Secondary Ion Mass Spectrometry (SIMS). The crystals obtained
have been structurally characterized by X-ray diffraction; the oxygen content has been determined both by
structural examination and by iodometric titration, and the electrical resistivity has been measured by the
four-thread technique. SIMS has been used to examine the growth features on the (001) faces of the crystals.
Impurity inclusions, ionic species from metals with different oxidation state, homo- and hetero-metal
clusters, their ionic yields and distribution in different matrices could usefully be compared to information
obtained with traditional methodologies utilized in this field.
Results obtained by SIMS for both NdBa2Cu3O7ÿ and EuBa2Cu3O7ÿ single crystals could provide new
instruments in estimating the property of superconducting materials. For example, the reaction of Al-Cu
substitution was observed on the crystal surface, as indicated by mixed cluster signals on the positive and
negative ion spectra confirming the already observed interaction between material from crucible and
REBa2Cu3O7ÿ (RE = Rare Earths, except for Ce, Pr and Tb).
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Fabrizio, Monica; Pagura, Cesare
Autori di Ateneo:
FABRIZIO MONICA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/115587
Pubblicato in:
RAPID COMMUNICATIONS IN MASS SPECTROMETRY (ONLINE)
Journal
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